I want contact information for people involved with directly probing
nanoscale (< 100nm) structures to measure their electrical
characteristics. This function is commonly referred to as
"nanoprobing". These people can be from industry, government or
universities anywhere in the world. The electrical characteristics
could be voltage, current, transistor gain, resistance, etc. that can
be measured with up to 4 probes on a 2 inch or smaller substrate.
This four point probing is also known as Kelvin measurement.
The largest current users of this technology are semiconductor
manufacturers in process development and failure analysis of SRAM.
I am not interested in people associated with projects requiring force
measurement or high frequency (>1K Hz) response.
Suggested search words:including derivatives: nanoscale,
nano-technology, nanoprobing, nano-probing, electrical, measurement,
semiconductor, SRAM, 90 nanometer, 65 nanometer, 45 nanometer, 35
nanometer, sub 100 nm, failure analysis, MEMS, NEMS, probe, test,
carbon nanotubes, Buckyball, Fullerenes, nanowire
Suggested sources: National Science Foundation (NSF), SEMITEC, NASA,
Army Research Office (ARO) and/or Laboratory (ARL), Air Force Research
Laboratory (AFRL), Air Force Office of Scientific Research (AFOSR),
Office of Naval Research (ONR), Naval Research Lab (NRL), Defense
Advanced Research Project Agency (DARPA), Nano Science and Technology
Institute(NSTI), Electronic Device Failure Analysis Society (EDFAS),
International Symposium for Testing and Failure Analysis (ISTFA)
Required information: Title of the source/article, link, contact name,
organization, location, search words in this source
Requested information: telephone number, email address